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Utilize our proven Etest SPC System Methodology for all future products

Customized for Your products

Our Product Roadmap:

Defect Density Reduction System

  • Wafer Sort Acceptance Module  
  • Wafer Inspection Acceptance Module  

 

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Product Framework & Roadmap 
CBM (Condition-Based Maintenance) System Framework and Products

With the implementation of the proposed PHM system as shown in the above figure, domain knowledge stored in the PHM-Equip and PHM-APC subsystems will feed forward and feed backward through the entire process flow. For example, device information from the PHM-BE subsystems will be easily shared with process and equipment engineers. Likewise, process information from PHM-Equip and PHM-APC subsystems can also be shared with Device and Test engineers to achieve a Fab-wide collaboration environment.

PHM: Prognostic Health Monitoring                PFM: Product Flow Management
APC: Advanced Process Control                    BE: Back End
DDR: Defect Density Reduction                     BEST: Back End Sort & Testing

 

 
Our products are designed and configurated as an add-on to the existing systems in order to automate the Engineering Decision-Making Processes.
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Quality Wise Knowledge Solutions
5210 Terner Way Suite 143
San Jose, CA 95136
Phone: 707-849-4985
Email: sales@qwiksinc.com
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