From the above Quality Curve diagram, you will find that Knowledge Management system will be the final step in completing the SPC, Historical data analysis, design of experiment stages of quality assurance programs.

Our product contains three built-in SPC rules (i.e WE_MRULE, WE_SRULE and WE_PFRULE) to report out of control Wafer Electrical Test parameters¡¦ shifting based on Western Electrical rule 1 and rule 5. In addition to the SPC rules, our product provides a library of process diagnosis rules which will automate the time consuming Wafer Electrical Test disposition process.